Akishima
23 cited products
68 protocol citations
Akishima is a leading provider of high-quality research products and solutions for scientific and industrial applications.
Their portfolio includes a diverse range of equipment, consumables, reagents, chemicals, and specialized software tools.
Akishima's products are widely used across various research disciplines, including life sciences, material science, and analytical chemistry, as evidenced by their extensive presence in academic publications, preprints, and patents.
By offering detailed insights into the usage and citation trends of their products, Akishima helps researchers and procurement teams make informed decisions to support their research activities.
Their portfolio includes a diverse range of equipment, consumables, reagents, chemicals, and specialized software tools.
Akishima's products are widely used across various research disciplines, including life sciences, material science, and analytical chemistry, as evidenced by their extensive presence in academic publications, preprints, and patents.
By offering detailed insights into the usage and citation trends of their products, Akishima helps researchers and procurement teams make informed decisions to support their research activities.
23 products from Akishima
Sourced in Japan
The JEM-2100 is a compact and versatile transmission electron microscope (TEM) designed for a wide range of applications. It features a LaB6 electron source and provides a maximum acceleration voltage of 200 kV. The instrument offers a high-resolution imaging capability and is suitable for various materials analysis tasks.
Sourced in Japan
The JEM-2100F is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a high-brightness electron gun and advanced electrostatic lenses to provide a stable, high-intensity electron beam. The JEM-2100F can achieve a high resolution of up to 0.10 nm, making it suitable for detailed observation and analysis of nanoscale structures.
Sourced in Japan
The JEM1230 is a compact and versatile scanning electron microscope (SEM) designed for high-quality imaging and analysis of a wide range of samples. It features a stable and reliable electron optical column, enabling users to capture detailed micrographs with high resolution. The instrument is equipped with a range of detectors for various imaging and analytical applications.
Sourced in Japan
The JSM-7800F is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a high-brightness electron gun, advanced optics, and a versatile sample handling system, enabling the observation and characterization of samples at the nanoscale level.
Sourced in Japan
The JSM-6700F is a field emission scanning electron microscope (FE-SEM) produced by Akishima. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The core function of the JSM-6700F is to provide detailed topographical and compositional information at the nanometer scale.
Sourced in Japan
The JMS 6360LV is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a low-vacuum operation mode, allowing for the examination of non-conductive and hydrated samples without the need for special preparation. The instrument provides high-quality images and valuable data for various applications, such as materials science, life sciences, and nanotechnology.
Sourced in Japan
The JSM-7600F is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a high-brightness Schottky field emission electron gun, advanced electron optics, and a variety of detection systems to enable detailed surface characterization at the nanoscale level.
Sourced in Japan
The JEOL2100F is a high-resolution transmission electron microscope (TEM) designed for advanced materials analysis. It features a field emission gun (FEG) source and is capable of achieving a high resolution of up to 0.19 nm. The JEOL2100F is suitable for a wide range of applications, including the study of nanomaterials, thin films, and biological samples.
Sourced in Japan
The JSM-5600LV is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a high-performance electron optical system, a large specimen chamber, and versatile imaging and analytical capabilities.
Sourced in Japan
The JEM 1011 is a transmission electron microscope (TEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of samples at the nanometer scale. The JEM 1011 provides a stable and reliable platform for a variety of applications in materials science, biology, and nanotechnology research.
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