JSM-6700F
The JSM-6700F is a field emission scanning electron microscope (FE-SEM) produced by Akishima. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The core function of the JSM-6700F is to provide detailed topographical and compositional information at the nanometer scale.
Lab products found in correlation
4 protocols using JSM-6700F
Characterization of Ag-Nanostructure Materials
Measuring Hydrogenated Si-DLC Film Thickness
To verify the step-depth measurements, we measured the film thickness by using two other methods, i.e., by observing section images of the hydrogenated Si-DLC films using SEM (JEOL, JSM-6700F, Akishima, Japan) and by estimating the film thickness from the X-ray reflectivity (XRR). The XRR measurement is described in the next section. In both methods, the reduction in film thickness was estimated by subtracting the film thickness after SR irradiation from that of the as-deposited film (522 nm).
Comprehensive Characterization of Multi-Walled Carbon Nanotubes
Scanning Electron Microscopy of D. melanoxylon Leaf
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