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JSM-6700F

Manufactured by Akishima
Sourced in Japan

The JSM-6700F is a field emission scanning electron microscope (FE-SEM) produced by Akishima. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The core function of the JSM-6700F is to provide detailed topographical and compositional information at the nanometer scale.

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4 protocols using JSM-6700F

The morphological shape and formation mechanism of Ag-nanostructure materials were characterized by using Transmission Electron Microscope (TEM, JEM-2100, Akishima, Tokyo, Japan) and High-resolution Transmission Electron Microscope (HR-TEM, FEI Talos F200C at 200 kV, Tokyo, Japan) and scanning electron microscopy (SEM, JSM-6700F, Akishima, Tokyo, Japan). The XRD analysis was performed with a Bruker D8 Advance X-ray diffractometer equipped with a Cu Ka radiation source (Karlsruhe, Germany). The measurements of optical properties were conducted by using a PerkinElmer UV/VIS Spectrometer Lambda25, manufactured by PerkinElmer, Ayer Rajah Crescent, Singapore Pte Ltd., and UV-2450 UV-vis Shimadzu spectrophotometer, Kyoto, Japan. Meanwhile, the hydrodynamic size and zeta potential were also measured by dynamic light scatting (DLS) using a Nano-ZS ZEN3600 Malvern Instruments, Worcestershire, UK. Also, the measurements of the cell viability were carried out by using Enzyme-Linked Immunosorbent Assay (ELISA, Thermo Fisher Scientific, Waltham, MA, USA) at 570 nm wavelength.
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We measured the film thickness with a stylus profiler to investigate the volume change of the hydrogenated Si-DLC film due to SR irradiation. For this measurement, the hydrogenated Si-DLC films were exposed to SR through an Au mesh mask (wire diameter 0.07 mm R, 100 mesh/inch). The step depth was estimated with the stylus profiler (Bruker, DEKTAK 6M, Billerica, MA, USA), which measured the difference in altitude between the area exposed to SR and the area shadowed by the mesh.
To verify the step-depth measurements, we measured the film thickness by using two other methods, i.e., by observing section images of the hydrogenated Si-DLC films using SEM (JEOL, JSM-6700F, Akishima, Japan) and by estimating the film thickness from the X-ray reflectivity (XRR). The XRR measurement is described in the next section. In both methods, the reduction in film thickness was estimated by subtracting the film thickness after SR irradiation from that of the as-deposited film (522 nm).
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3

Comprehensive Characterization of Multi-Walled Carbon Nanotubes

The pore volume, surface area, and pore diameter of the MWCNTs were evaluated using an ASAP 2020 adsorption analyzer (Micromeritics, Norcross, GA, USA) at −196 °C. An X-ray diffractometer (X’pert Pro System, PANalytical, Malvern, UK) with Cu Kα radiation was employed to observe the crystalline phase of the MWCNTs. A field-emission scanning electron microscope (JEOL JSM-6700F, Akishima, Tokyo, Japan) and a transmission electron microscope (JEOL JEM-1200CX II, Akishima, Tokyo, Japan) were used to examine their morphological features. A Fourier transmission infrared spectroscope (FTIR-8300, Shimadzu, Nakagyo-ku, Kyoto, Japan) was employed to examine the functional groups of the MWCNTs. Graphitization was assessed using a confocal Raman spectroscope (Renishaw, Gloucestershire, UK) with 632 nm He–Ne laser excitation. The stability of the MWCNTs before and after modification was examined using a thermogravimetric analyzer (Mettler Toledo, OH, USA, model TGA/SDTA851e). The surface elements on the MWCNTs were analyzed using an X-ray photoelectron spectroscope (Esca Lab 250Xi, Thermo Scientific, Waltham, MA, USA). The C1s peak at 284.60 eV was employed to calibrate the binding energy. The amounts of metallic impurities in the MWCNTs were determined using an inductively coupled plasma–mass spectrometer (ICP-MS) (Konton Plasmakon, Eching, Germany, model S-35).
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In order to understand the extraction mechanism, marc obtained from various extraction methods were subjected to scanning electron micrographs. After removing the solvent, the remaining D. melanoxylon leaf samples were plunged in liquid nitrogen and then cut with a cold knife. The sectioned particles were fixed on a specimen holder with aluminium tape and then sputtered with platinum. All the specimens were examined with a JEOL JSM-6700F (Akishima, Tokyo, Japan) scanning electron microscopy under high vacuum condition at different magnification.
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