Inca x sight 7582

The morphology and pore size of the scaffolds were observed on a JEOL JSM-6360 LV scanning electron microscope (SEM) (Akishima, Tokyo, Japan) operating at 20 kV; each sample was coated with a thin layer of gold using a Denton Desk II Sputter Coater (Moorestown, NJ, USA). Energy-dispersive X-ray spectroscopy (EDX) (Oxford Instruments, INCA X-Sight 7582, High Wycombe, UK), coupled with the microscope, was used to determine the elemental composition. The chemical structures of the scaffolds were studied using an FTIR spectrophotometer (Nicolet Thermo-Scientific 8700, Waltham, MA, USA) with the attenuated total reflectance (ATR) technique. Spectra were collected over 4000 to 600 cm⁻¹ with a zinc selenide crystal. The average number of scans was 100, with a resolution of 4.0 cm⁻¹, and corrected for H₂O and CO₂. Raman determination was performed using the InVia™ Raman Renishaw microscope (Wotton-under-Edge, Gloucestershire), with a laser of 633 nm, a power of 50% analyzed in the spectral interval between 200 and 3200 cm⁻¹, a power of 100%, grid of 1800, and an objective of 50× with an exposure time of 60 s. The thermogravimetric analysis was carried out using a TGA 8000™ from PerkinElmer (Waltham, MA, USA), in the temperature range 45–750 °C and under an inert atmosphere (i.e., nitrogen) at a heating rate of 10 °C/min.

The samples were coated with gold in a Denton Desk II Sputter Coater (Moorestown, NJ, USA) (50 s, 40 mA). The morphology of film surface was examined using a JEOL, JMS 6360LV (Akishima Tokyo, Japan) with acceleration voltage of 20 kV. Energy-dispersive X-ray spectroscopy (EDX) (Oxford Instruments, INCA X-Sight 7582, High Wycombe, UK) coupled with the microscope, was used to obtained elemental composition.