Ssx 550

An inductively
coupled plasma optical emission spectrometer^{35 (link)} and chemical titration were utilized to determine objective elements
in samples. An X-ray diffractometer^{36 (link)} was
utilized to characterize the various mineral phases in the samples
at an operating voltage of 40 kV, an operating current of 40 kA, a
wavelength of 1.541 Å, and a scan speed of 8°/min.^{37 (link)} A vibrating sample magnetometer (JDAW-200D,
Ying Pu Magnetic Technology Development, China)^{9 (link)} was employed to quantify the magnetic characteristics of
the various samples. In order to observe deeply the transformation
in the microstructure of the samples after roasting, the microstructure
was observed, photographed, and analyzed by scanning electron microscopy
and energy-dispersive X-ray spectroscopy (SEM-EDS, SSX-550, Shimadzu,
Japan).^{38 (link)}

The chemical composition
of fly ash, silica, and zeolite A was analyzed using a WD-X-ray fluorescence
spectrometer (XRF) (ZSX PrimusII, Rigaku, USA). The phase and crystal
structure of zeolite A were determined by X-ray diffraction (XRD)
(X’Pert Pro, PANalytical, Netherlands) with Cu Kα radiation
(λ = 1.5406 Å) at 40 kV and 30 mA. The surface area and
particle size distribution of zeolite A were measured by Brunauer–Emmett–Teller
(BET) (ASAP2460, Micromeritics, USA). The morphology of zeolite A
was examined by using a scanning electron microscope (SEM) (SSX-550,
Shimadzu, Japan).

Scanning electron microscopy (SEM): scanning electron microscopy SSX-550 (Shimadzu, Kyoto, Kyoto, Japan) enable a qualitative characterization of the surface morphology of Group 1 and Group 2 implants (n=2/group) at an accelerating voltage of 15 kV, focal width (FW) of 4.0, and Working Distance (WD) of 18 and 19 for magnifications of 1000X and 3000X, respectively.
Confocal three-dimensional laser scanning microscopy: μSurf Custom (Nanofocus AG, Oberhausen, North Rhine - Westphalia, Germany) allowed for the quantitative evaluation of the surface roughness of different implant surfaces. Three implants of each group were used to measure the surface roughness values (mean values). The μSoft Analysis Premium software program (Nanofocus AG, Oberhausen, North Rhine - Westphalia, Germany) was used to calculate 3D roughness parameters such as Ssk (amplitude distribution skew), Sa (arithmetic mean deviation of the peak-to-valley height of the surface), Sz (the average distance between the highest peak and the deepest valley), Sdr (indicates the surface area enlargement) and Sds (indicates the density of peaks on the surface). The Ssk parameter identifies the distribution of valleys (Ssk<0) or peaks (Ssk>0) on the surface. If the Ssk is close to zero, it has a gaussian surface^21,30.
X-ray photoelectron spectroscopy (XPS): The chemical composition of the different groups was examined by X-ray photoelectron spectroscopy (XPS) VG/SSI 2803 S-Probe (Kratos Analytical Ltd., Hofheim,Hesse, Germany) using an aluminum anode at 300 W (15 kV x 20 mA). A monochromatic Al Kα radiation source was used; the analysis spot size was 0.25x1 mm, and the measurement step size was 1 eV. Overview spectra were obtained over an energy range of 0–1100 eV. The emission angle between the incident beam and the surface of the sample was 35°. For elemental analysis, the survey spectra were analyzed and the detected elements were normalized. Two disks of each group were used for analysis.
Contact angle analysis: Universal Goniometer DSA 20E (KrüssHamburg, Germany) allowed the static contact angles on disks to mimic the implant surfaces for the hydrophilicity analysis by assessing by sessile-drop technique¹⁸. The measurements were performed on the surfaces (n=5 disks/group) after a drop of SBF (simulated body fluid) solution was deposited onto the sample surfaces at room temperature. Fifteen contact angle values were obtained (one value per second in each sample).