Ssx 550
The SSX-550 is a compact and versatile X-ray diffractometer designed for a wide range of materials analysis applications. It features a high-intensity X-ray source and a advanced detector system, enabling efficient and accurate collection of diffraction data. The SSX-550 is suitable for a variety of sample types and can perform phase identification, quantitative analysis, and structural characterization.
Lab products found in correlation
43 protocols using ssx 550
Characterization of XMPC materials
Characterization of XMPC Materials
Comprehensive Nanomaterial Characterization
Scanning Electron Microscopy Analysis of RADFP and SMADFP
Tribological Properties of mrGO-Cu/Al Composites
Characterization of Copper-bearing Biotite
Optical Characterization of Thin Films
Characterization of Y2O3 Nanoparticles
Comprehensive Surface Characterization of Protective Coatings
Characterization of Lignin-Based Adsorbents
The ESPs of five FQs (OFL, NOR, CIP, ENR, and FLE), two molecular probes (FLU and FPP), and two LN-based adsorbents (LNE and LENC) were theoretically optimized by DFT with Gaussian 09 program at b3lyp/6-31 g* level.
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